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>UNE standards>UNE EN 61967-2:2005 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method (Endorsed by AENOR in January of 2006.)
in stockReleased: 2006-01-01
UNE EN 61967-2:2005 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method (Endorsed by AENOR in January of 2006.)

UNE EN 61967-2:2005

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method (Endorsed by AENOR in January of 2006.)

Circuitos integrados. Mediciones de las emisiones electromagnéticas de 150 kHz a 1 GHz. Parte 2: Mediciones de la emisiones radiadas, método de célula TEM y célula TEM de banda ancha. (Ratificada por AENOR en enero de 2006.)

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Standard number:UNE EN 61967-2:2005
Pages:26
Released:2006-01-01
Status:Standard
DESCRIPTION

This standard UNE EN 61967-2:2005 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz -- Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method (Endorsed by AENOR in January of 2006.) is classified in these ICS categories:

  • 31.080.99
Categories:
UNE standards
31.080.99 Other semiconductor devices
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