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>UNE standards>UNE EN 62435-2:2017 - Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration Mechanisms (Endorsed by Asociación Española de Normalización in June of 2017.)
in stockReleased: 2017-06-01
UNE EN 62435-2:2017 - Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration Mechanisms (Endorsed by Asociación Española de Normalización in June of 2017.)

UNE EN 62435-2:2017

Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration Mechanisms (Endorsed by Asociación Española de Normalización in June of 2017.)

Componentes electrónicos. Almacenamiento a largo plazo de dispositivos electrónicos semiconductores. Parte 2: Mecanismos de deterioro (Ratificada por la Asociación Española de Normalización en junio de 2017.)

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Standard number:UNE EN 62435-2:2017
Pages:26
Released:2017-06-01
Status:Standard
DESCRIPTION

UNE EN 62435-2:2017

This part of the standard, Part 2 Deterioration Mechanisms, is concerned with the way that components degrade over time depending on the storage conditions applied. This part also includes guidance on test methods that may be used to assess generic Deterioration Mechanisms. Mechanisms which apply to specific component types are detailed in parts 5 to 9 of this standard.