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>UNE standards>UNE EN IEC 63616:2026 Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies - Balanced-type circular disk resonator method (Endorsed by Asociación Española de Normalización in March of 2026.)
in stockReleased: 2026-03-01
UNE EN IEC 63616:2026 Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies - Balanced-type circular disk resonator method (Endorsed by Asociación Española de Normalización in March of 2026.)

UNE EN IEC 63616:2026

Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies - Balanced-type circular disk resonator method (Endorsed by Asociación Española de Normalización in March of 2026.)

Medición de la conductividad de películas metálicas delgadas en frecuencias de microondas y ondas milimétricas. Método del resonador de disco circular de tipo equilibrado (Ratificada por la Asociación Española de Normalización en marzo de 2026.)

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Standard number:UNE EN IEC 63616:2026
Pages:21
Released:2026-03-01
Status:Standard
DESCRIPTION

This standard UNE EN IEC 63616:2026 Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies - Balanced-type circular disk resonator method (Endorsed by Asociación Española de Normalización in March of 2026.) is classified in these ICS categories:

  • 17.220.20
  • 29.050