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>UNE standards>UNE EN ISO 9455-17:2024 - Soft soldering fluxes - Test methods - Part 17: Surface insulation resistance comb test and electrochemical migration test of flux residues (ISO 9455-17:2024)
in stockReleased: 2024-10-30
UNE EN ISO 9455-17:2024 - Soft soldering fluxes - Test methods - Part 17: Surface insulation resistance comb test and electrochemical migration test of flux residues (ISO 9455-17:2024)

UNE EN ISO 9455-17:2024

Soft soldering fluxes - Test methods - Part 17: Surface insulation resistance comb test and electrochemical migration test of flux residues (ISO 9455-17:2024)

Fundentes para soldeo blando. Métodos de ensayo. Parte 17: Ensayo de la resistencia del aislamiento superficial y ensayo de migración electroquímica de los residuos del fundente. (ISO 9455-17:2024).

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Standard number:UNE EN ISO 9455-17:2024
Pages:30
Released:2024-10-30
Status:Standard
Pages (Spanish):34
DESCRIPTION

UNE EN ISO 9455-17:2024

This document specifies a method of testing for deleterious effects that may arise from flux residues after soldering or tinning test coupons. The test is applicable to type 1 and type 2 fluxes, as specified in ISO 9454-1, in solid or liquid form, or in the form of flux-cored solder wire, solder preforms or solder paste constituted with eutectic or near-eutectic tin/lead (Sn/Pb) or Sn95,5Ag3Cu0,5 or other lead free solders as agreed between user and supplier (ISO 9453). NOTE This test method is also applicable to fluxes for use with lead containing and lead-free solders. However, the soldering temperatures may be adjusted with agreement between tester and customer.