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UNE EN 62374-1:2010
Semiconductor devices -- Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers (Endorsed by AENOR in March of 2011.)
Semiconductor devices -- Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers (Endorsed by AENOR in March of 2011.)
Released: 2011-03-01
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82.50 EUR
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83.60 EUR
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75.90 EUR
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77.00 EUR
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74.80 EUR
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89.10 EUR
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UNE EN 62419:2009
Control technology - Rules for the designation of measuring instruments (Endorsed by AENOR in May of 2009.)
Control technology - Rules for the designation of measuring instruments (Endorsed by AENOR in May of 2009.)
Released: 2009-05-01
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150.70 EUR
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136.40 EUR
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UNE EN 62453-306:2009
Field device tool (FDT) interface specification -- Part 306: Communication profile integration - IEC 61784 CPF 6 (Endorsed by AENOR in February of 2010.)
Field device tool (FDT) interface specification -- Part 306: Communication profile integration - IEC 61784 CPF 6 (Endorsed by AENOR in February of 2010.)
Released: 2010-02-01
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