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UNE EN 60708:2010/AC:2016-08
Low-frequency cables with polyolefin insulation and moisture barrier polyolefin sheath
Low-frequency cables with polyolefin insulation and moisture barrier polyolefin sheath
Released: 2016-10-11
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2.19 EUR
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2.19 EUR
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2.19 EUR
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2.19 EUR
UNE EN 60721-3-6/A2:1998
CLASSIFICATION OF ENVIRONMENTAL CONDITIONS. PART 3: CLASSIFICATION OF GROUPS OF ENVIRONMENTAL PARAMETERS AND THEIR SEVERITIES. SECTIION 6: SHIP ENVIRONMENT.
CLASSIFICATION OF ENVIRONMENTAL CONDITIONS. PART 3: CLASSIFICATION OF GROUPS OF ENVIRONMENTAL PARAMETERS AND THEIR SEVERITIES. SECTIION 6: SHIP ENVIRONMENT.
Released: 1998-01-30
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52.80 EUR
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52.80 EUR
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44.00 EUR
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44.00 EUR
UNE EN 60730-2-1:1998
AUTOMATIC ELECTRICAL CONTROLS FOR HOUSEHOLD AND SIMILAR USE. PART 2: PARTICULAR REQUIREMENTS FOR ELECTRICAL CONTROLS FOR ELECTRICAL HOUSEHOLD APPLIANCES.
AUTOMATIC ELECTRICAL CONTROLS FOR HOUSEHOLD AND SIMILAR USE. PART 2: PARTICULAR REQUIREMENTS FOR ELECTRICAL CONTROLS FOR ELECTRICAL HOUSEHOLD APPLIANCES.
Released: 1998-09-15
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79.20 EUR
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66.00 EUR
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66.00 EUR
UNE EN 60730-2-6:2016
Automatic electrical controls - Part 2-6: Particular requirements for automatic electrical pressure sensing controls including mechanical requirements
Automatic electrical controls - Part 2-6: Particular requirements for automatic electrical pressure sensing controls including mechanical requirements
Released: 2016-05-18
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106.92 EUR
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106.92 EUR
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89.10 EUR
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89.10 EUR
English PDF
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84.48 EUR
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84.48 EUR
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70.40 EUR
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70.40 EUR
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91.08 EUR
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91.08 EUR
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75.90 EUR
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75.90 EUR
UNE EN 60749-14:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 14: Robustness of terminations (lead integrity)
Semiconductor devices - Mechanical and climatic test methods -- Part 14: Robustness of terminations (lead integrity)
Released: 2004-06-11
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79.20 EUR
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66.00 EUR
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UNE EN 60749-19:2003
Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength
Semiconductor devices - Mechanical and climatic test methods -- Part 19: Die shear strength
Released: 2003-11-21
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46.20 EUR
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38.50 EUR
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UNE EN 60749-2:2003
Semiconductor devices - Mechanical and climatic test methods -- Part 2: Low air pressure.
Semiconductor devices - Mechanical and climatic test methods -- Part 2: Low air pressure.
Released: 2003-05-30
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52.80 EUR
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44.00 EUR
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UNE EN 60749-24:2005
Semiconductor devices - Mechanical and climatic test methods -- Part 24: Accelerated moisture resistance - Unbiased HAST
Semiconductor devices - Mechanical and climatic test methods -- Part 24: Accelerated moisture resistance - Unbiased HAST
Released: 2005-03-16
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62.04 EUR
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51.70 EUR
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UNE EN 60749-32:2004
Semiconductor devices - Mechanical and climatic test methods -- Part 32: Flammability of plastic-encapsulated devices (externally induced)
Semiconductor devices - Mechanical and climatic test methods -- Part 32: Flammability of plastic-encapsulated devices (externally induced)
Released: 2004-03-18
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38.50 EUR
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UNE EN 60749-32:2004/A1:2011
Semiconductor devices - Mechanical and climatic test methods -- Part 32: Flammability of plastic-encapsulated devices (externally induced)
Semiconductor devices - Mechanical and climatic test methods -- Part 32: Flammability of plastic-encapsulated devices (externally induced)
Released: 2011-01-19
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46.20 EUR
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38.50 EUR
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38.50 EUR