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UNE EN 61988-2-4:2011
Plasma display panels - Part 2-4: Measuring methods - Visual quality: Image artifacts (Endorsed by AENOR in January of 2012.)
Plasma display panels - Part 2-4: Measuring methods - Visual quality: Image artifacts (Endorsed by AENOR in January of 2012.)
Released: 2012-01-01
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95.76 USD
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UNE EN 62007-2:2009
Semiconductor optoelectronic devices for fibre optic system applications -- Part 2: Measuring methods (Endorsed by AENOR in June of 2009.)
Semiconductor optoelectronic devices for fibre optic system applications -- Part 2: Measuring methods (Endorsed by AENOR in June of 2009.)
Released: 2009-06-01
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98.35 USD
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98.35 USD
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76.35 USD
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76.35 USD
UNE EN 62027:2012
Preparation of object lists, including parts lists (Endorsed by AENOR in March of 2012.)
Preparation of object lists, including parts lists (Endorsed by AENOR in March of 2012.)
Released: 2012-03-01
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93.18 USD
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93.18 USD
UNE EN 62040-4:2013
Uninterruptible power systems (UPS) - Part 4: Environmental aspects - Requirements and reporting (Endorsed by AENOR in November of 2013.)
Uninterruptible power systems (UPS) - Part 4: Environmental aspects - Requirements and reporting (Endorsed by AENOR in November of 2013.)
Released: 2013-11-01
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81.53 USD
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81.53 USD
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129.41 USD
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129.41 USD
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77.65 USD
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77.65 USD
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90.59 USD
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90.59 USD
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49.18 USD
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49.18 USD
UNE EN 62047-4:2010
Semiconductor devices - Micro-electromechanical devices -- Part 4: Generic specification for MEMS (Endorsed by AENOR in February of 2011.)
Semiconductor devices - Micro-electromechanical devices -- Part 4: Generic specification for MEMS (Endorsed by AENOR in February of 2011.)
Released: 2011-02-01
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84.12 USD
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84.12 USD
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91.88 USD
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91.88 USD
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2.58 USD
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2.58 USD