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Homepage>BS Standards>31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general>20/30422991 DC BS EN IEC 60747-5-14. Semiconductor devices Part 5-14. Optoelectronic devices. Light emitting diodes. Test method of the surface temperature based on the thermoreflectance method
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immediate downloadReleased: 2020-08-28
20/30422991 DC BS EN IEC 60747-5-14. Semiconductor devices Part 5-14. Optoelectronic devices. Light emitting diodes. Test method of the surface temperature based on the thermoreflectance method

20/30422991 DC

BS EN IEC 60747-5-14. Semiconductor devices Part 5-14. Optoelectronic devices. Light emitting diodes. Test method of the surface temperature based on the thermoreflectance method

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Standard number:20/30422991 DC
Pages:22
Released:2020-08-28
Status:Draft for Comment
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20/30422991 DC


This standard 20/30422991 DC BS EN IEC 60747-5-14. Semiconductor devices is classified in these ICS categories:
  • 31.260 Optoelectronics. Laser equipment
  • 31.080.01 Semiconductor devices in general
  • 31.080.99 Other semiconductor devices