31.080.01 Semiconductor devices in general
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Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
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Released: 2013-06-19
BS EN 60747-14-6. Semiconductor devices. Part 14-6. Semiconductor sensor. Humidity sensor
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Released: 2013-06-19
BS EN 60747-14-7. Semiconductor devices. Part 14-7. Semiconductor sensor. Flow meter
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Released: 2013-06-19
BS EN 60747-14-8. Semiconductor devices. Part 14-8. Semiconductor sensors. Capacitive degradation sensor of liquid
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Released: 2013-05-08
BS EN 60191-6-16. Mechanical standardization of semiconductor devices. Part 6-16. Glossary of semiconductor tests and burn-in sockets for BGA, LGA, FBGA and FLGA
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Released: 2013-09-10
BS EN 60191-1. Mechanical standardization of semiconductor devices. Part 1. General rules for the preparation of outline drawings of discrete devices
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Released: 2013-09-11
BS EN 60191-2/F71. Proposed new package outline. P-ZMP-P89
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Released: 2018-04-10
BS EN 60747-5-5. Semiconductor devices Part 5-5. Optoelectronic devices. Photocouplers
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Released: 2018-04-10
BS EN 62830-5. Semiconductor devices. Semiconductor devices for energy harvesting and generation Part 5. Test method for measuring generated power from flexible thermoelectric devices
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Released: 2018-06-22
BS IEC 60747-14-11. Semiconductor devices Part 14-11. Semiconductor sensors. Test method of surface acoustic wave based integrated sensor for measuring ultra violet, illumination and temperature
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Released: 2018-07-13
BS EN 60749-20-1. Semiconductor devices. Mechanical and climatic test methods Part 20-1. Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat
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Released: 2018-12-06
BS EN IEC 62830-7. Semiconductor devices. Semiconductor devices for energy harvesting and generation Part 7. Linear sliding mode triboelectric energy harvesting
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Released: 2018-12-04
BS EN IEC 62047-37. Semiconductor devices. Micro-electromechanical devices Part 37. Environmental test methods of MEMS piezoelectric thin films for sensor application