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31.080.01 Semiconductor devices in general
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BS IEC 62047-29:2017
Semiconductor devices. Micro-electromechanical devices Electromechanical relaxation test method for freestanding conductive thin-films under room temperature
Semiconductor devices. Micro-electromechanical devices Electromechanical relaxation test method for freestanding conductive thin-films under room temperature
Released: 2018-03-15
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200.00 USD
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20.00 USD
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Reading the standardfor 24 hours
60.00 USD
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In stock
200.00 USD
BS IEC 62483:2013
Environmental acceptance requirements for tin whisker susceptibility of tin and tin alloy surface finishes on semiconductor devices
Environmental acceptance requirements for tin whisker susceptibility of tin and tin alloy surface finishes on semiconductor devices
Released: 2013-10-31
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386.67 USD
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Reading the standardfor 1 hour
38.67 USD
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Reading the standardfor 24 hours
116.00 USD
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In stock
386.67 USD
English Secure PDF
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277.33 USD
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Reading the standardfor 1 hour
27.73 USD
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
83.20 USD
English Hardcopy
In stock
277.33 USD
English Secure PDF
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325.33 USD
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32.53 USD
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97.60 USD
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325.33 USD
BS IEC 60747-16-2:2001
Semiconductor devices Microwave integrated circuits. Frequency prescalers
Semiconductor devices Microwave integrated circuits. Frequency prescalers
Released: 2008-01-31
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325.33 USD
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
32.53 USD
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
97.60 USD
English Hardcopy
In stock
325.33 USD
English Secure PDF
Immediate download
200.00 USD
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
20.00 USD
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
60.00 USD
English Hardcopy
In stock
200.00 USD
BS EN 62779-3:2016
Semiconductor devices. Semiconductor interface for human body communication Functional type and its operational conditions
Semiconductor devices. Semiconductor interface for human body communication Functional type and its operational conditions
Released: 2016-06-30
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200.00 USD
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20.00 USD
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60.00 USD
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200.00 USD
BS EN IEC 60068-2-13:2021
Environmental testing Tests. Test M: Low air pressure
Environmental testing Tests. Test M: Low air pressure
Released: 2021-04-26
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200.00 USD
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20.00 USD
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Reading the standardfor 24 hours
60.00 USD
English Hardcopy
In stock
200.00 USD
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Immediate download
277.33 USD
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
27.73 USD
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
83.20 USD
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277.33 USD
BS IEC 63284:2022
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Released: 2022-11-11
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200.00 USD
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20.00 USD
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60.00 USD
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200.00 USD
BS IEC 60747-18-4:2023
Semiconductor devices Semiconductor bio sensors. Evaluation method of noise characteristics of lens-free CMOS photonic array sensors
Semiconductor devices Semiconductor bio sensors. Evaluation method of noise characteristics of lens-free CMOS photonic array sensors
Released: 2023-03-27
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200.00 USD
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20.00 USD
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60.00 USD
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200.00 USD
24/30491834 DC
Draft BS EN 60747-14-12 ED1 Semiconductor devices Part 14-12: Semiconductor sensors - Performance test methods for CMOS imager-based gas sensors
Draft BS EN 60747-14-12 ED1 Semiconductor devices Part 14-12: Semiconductor sensors - Performance test methods for CMOS imager-based gas sensors
Released: 2024-04-23
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26.67 USD
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26.67 USD