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31.080.01 Semiconductor devices in general
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BS QC 750100:1986+A2:1996
Harmonized system of quality assessment for electronic components. Discrete semiconductor devices. Sectional specification
Harmonized system of quality assessment for electronic components. Discrete semiconductor devices. Sectional specification
Released: 2010-01-31
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195.00 USD
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19.50 USD
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58.50 USD
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195.00 USD
PD ES 59008-4-1:2001
Data requirements for semiconductor die. Specific requirements and recommendations Test and quality
Data requirements for semiconductor die. Specific requirements and recommendations Test and quality
Released: 2001-03-15
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163.80 USD
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16.38 USD
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49.14 USD
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163.80 USD
PD ES 59008-5-1:2001
Data requirements for semiconductor die. Particular requirements and recommendations for die types Bare die
Data requirements for semiconductor die. Particular requirements and recommendations for die types Bare die
Released: 2001-07-15
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163.80 USD
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16.38 USD
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49.14 USD
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163.80 USD
PD ES 59008-5-2:2001
Data requirements for semiconductor die. Particular requirements and recommendations for die types Bare die with added connection structures
Data requirements for semiconductor die. Particular requirements and recommendations for die types Bare die with added connection structures
Released: 2001-06-15
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163.80 USD
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16.38 USD
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49.14 USD
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163.80 USD
PD ES 59008-5-3:2001
Data requirements for semiconductor die. Particular requirements and recommendations for die types Minimally-packaged die
Data requirements for semiconductor die. Particular requirements and recommendations for die types Minimally-packaged die
Released: 2001-12-05
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163.80 USD
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16.38 USD
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49.14 USD
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163.80 USD
PD ES 59008-6-2:2001
Data requirements for semiconductor die. Exchange data formats and data dictionary Data dictionary
Data requirements for semiconductor die. Exchange data formats and data dictionary Data dictionary
Released: 2001-06-15
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270.40 USD
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27.04 USD
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81.12 USD
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270.40 USD
PD IEC TR 62380:2004
Reliability data handbook. Universal model for reliability prediction of electronics components, PCBs and equipment
Reliability data handbook. Universal model for reliability prediction of electronics components, PCBs and equipment
Released: 2004-08-17
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408.20 USD
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40.82 USD
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122.46 USD
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408.20 USD
PD IEC TR 63378-1:2021
Thermal standardization on semiconductor packages Thermal resistance and thermal parameter of BGA, QFP type semiconductor packages
Thermal standardization on semiconductor packages Thermal resistance and thermal parameter of BGA, QFP type semiconductor packages
Released: 2022-01-11
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270.40 USD
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27.04 USD
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81.12 USD
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270.40 USD
PD IEC/TR 63133:2017
Semiconductor devices. Scan based ageing level estimation for semiconductor devices
Semiconductor devices. Scan based ageing level estimation for semiconductor devices
Released: 2018-01-29
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195.00 USD
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19.50 USD
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58.50 USD
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195.00 USD