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31.080.01 Semiconductor devices in general
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BS EN 60749-6:2017
Semiconductor devices. Mechanical and climatic test methods Storage at high temperature
Semiconductor devices. Mechanical and climatic test methods Storage at high temperature
Released: 2017-11-24
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178.67 USD
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17.87 USD
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53.60 USD
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178.67 USD
BS EN IEC 60749-18:2019
Semiconductor devices. Mechanical and climatic test methods Ionizing radiation (total dose)
Semiconductor devices. Mechanical and climatic test methods Ionizing radiation (total dose)
Released: 2019-06-10
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293.33 USD
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29.33 USD
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88.00 USD
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293.33 USD
BS 3934-5:1997
Mechanical standardization of semiconductor devices Recommendations applying to tape automated bonding (TAB) of integrated circuits
Mechanical standardization of semiconductor devices Recommendations applying to tape automated bonding (TAB) of integrated circuits
Released: 1997-09-15
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344.00 USD
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34.40 USD
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103.20 USD
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344.00 USD
BS EN 60191-6-19:2010
Mechanical standardization of semiconductor devices Measurement methods of the package warpage at elevated temperature and the maximum permissible warpage
Mechanical standardization of semiconductor devices Measurement methods of the package warpage at elevated temperature and the maximum permissible warpage
Released: 2010-06-30
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210.67 USD
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21.07 USD
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63.20 USD
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210.67 USD
BS IEC 60747-14-1:2010
Semiconductor devices Semiconductor sensors. Generic specification for sensors
Semiconductor devices Semiconductor sensors. Generic specification for sensors
Released: 2010-04-30
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293.33 USD
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29.33 USD
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88.00 USD
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293.33 USD
BS EN 60191-4:2014+A1:2018
Mechanical standardization of semiconductor devices Coding system and classification into forms of package outlines for semiconductor device packages
Mechanical standardization of semiconductor devices Coding system and classification into forms of package outlines for semiconductor device packages
Released: 2018-05-30
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344.00 USD
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34.40 USD
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103.20 USD
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344.00 USD
BS EN IEC 60749-13:2018
Semiconductor devices. Mechanical and climatic test methods Salt atmosphere
Semiconductor devices. Mechanical and climatic test methods Salt atmosphere
Released: 2018-04-30
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210.67 USD
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21.07 USD
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63.20 USD
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210.67 USD
BS EN 60749-38:2008
Semiconductor devices. Mechanical and climatic test methods Soft error test method for semiconductor devices with memory
Semiconductor devices. Mechanical and climatic test methods Soft error test method for semiconductor devices with memory
Released: 2008-06-30
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210.67 USD
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21.07 USD
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63.20 USD
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210.67 USD
BS EN IEC 60749-26:2018
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
Released: 2018-04-30
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408.00 USD
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40.80 USD
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122.40 USD
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408.00 USD
BS EN IEC 60747-16-6:2019
Semiconductor devices Microwave integrated circuits. Frequency multipliers
Semiconductor devices Microwave integrated circuits. Frequency multipliers
Released: 2019-09-02
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293.33 USD
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29.33 USD
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88.00 USD
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293.33 USD
BS IEC 60747-18-3:2019
Semiconductor devices Semiconductor bio sensors. Fluid flow characteristics of lens-free CMOS photonic array sensor package modules with fluidic system
Semiconductor devices Semiconductor bio sensors. Fluid flow characteristics of lens-free CMOS photonic array sensor package modules with fluidic system
Released: 2020-01-14
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293.33 USD
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29.33 USD
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88.00 USD
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293.33 USD
BS IEC 60747-19-1:2019
Semiconductor devices Smart sensors. Control scheme of smart sensors
Semiconductor devices Smart sensors. Control scheme of smart sensors
Released: 2019-11-29
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293.33 USD
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
29.33 USD
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Reading the standardfor 24 hours
88.00 USD
English Hardcopy
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293.33 USD