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31.080.01 Semiconductor devices in general
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PD IEC TR 62380:2004
Reliability data handbook. Universal model for reliability prediction of electronics components, PCBs and equipment
Reliability data handbook. Universal model for reliability prediction of electronics components, PCBs and equipment
Released: 2004-08-17
English Secure PDF
Immediate download
391.00 USD
English Hardcopy
In stock
391.00 USD
PD IEC TR 63378-1:2021
Thermal standardization on semiconductor packages Thermal resistance and thermal parameter of BGA, QFP type semiconductor packages
Thermal standardization on semiconductor packages Thermal resistance and thermal parameter of BGA, QFP type semiconductor packages
Released: 2022-01-11
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Immediate download
259.76 USD
English Hardcopy
In stock
259.76 USD
PD IEC/TR 63133:2017
Semiconductor devices. Scan based ageing level estimation for semiconductor devices
Semiconductor devices. Scan based ageing level estimation for semiconductor devices
Released: 2018-01-29
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186.71 USD
English Hardcopy
In stock
186.71 USD