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Homepage>BS Standards>31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general>BS EN IEC 60749-26:2018 - TC Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
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BS EN IEC 60749-26:2018 - TC Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)

BS EN IEC 60749-26:2018 - TC

Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)

CURRENCY
LANGUAGE
English
Standard number:BS EN IEC 60749-26:2018 - TC
Released:2020-02-27
ISBN:978 0 539 11726 4
Status:TrackedChanges
DESCRIPTION
This standard BS EN IEC 60749-26:2018 - TC Tracked Changes. Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general

This product includes: