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31.080.01 Semiconductor devices in general
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BS EN IEC 60749-30:2020
Semiconductor devices. Mechanical and climatic test methods Preconditioning of non-hermetic surface mount devices prior to reliability testing
Semiconductor devices. Mechanical and climatic test methods Preconditioning of non-hermetic surface mount devices prior to reliability testing
Released: 2020-09-30
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195.00 USD
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19.50 USD
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
58.50 USD
English Hardcopy
In stock
195.00 USD
BS EN IEC 60749-37:2022 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Board level drop test method using an accelerometer
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Board level drop test method using an accelerometer
Released: 2022-12-20
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353.60 USD
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353.60 USD
BS EN IEC 60749-37:2022
Semiconductor devices. Mechanical and climatic test methods Board level drop test method using an accelerometer
Semiconductor devices. Mechanical and climatic test methods Board level drop test method using an accelerometer
Released: 2022-11-22
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270.40 USD
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
27.04 USD
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
81.12 USD
English Hardcopy
In stock
270.40 USD
English Secure PDF
Immediate download
254.80 USD
English Hardcopy
In stock
254.80 USD
English Secure PDF
Immediate download
195.00 USD
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
19.50 USD
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
58.50 USD
English Hardcopy
In stock
195.00 USD
BS EN IEC 60749-41:2020
Semiconductor devices. Mechanical and climatic test methods Standard reliability testing methods of non-volatile memory devices
Semiconductor devices. Mechanical and climatic test methods Standard reliability testing methods of non-volatile memory devices
Released: 2020-09-09
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270.40 USD
You can read the standard for 1 hour. More information in the category: E-reading
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27.04 USD
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Reading the standardfor 24 hours
81.12 USD
English Hardcopy
In stock
270.40 USD
BS EN IEC 60749-5:2024 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life test
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life test
Released: 2024-02-09
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254.80 USD
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In stock
254.80 USD
BS EN IEC 60749-5:2024
Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life test
Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life test
Released: 2024-02-06
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195.00 USD
You can read the standard for 1 hour. More information in the category: E-reading
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19.50 USD
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Reading the standardfor 24 hours
58.50 USD
English Hardcopy
In stock
195.00 USD
BS EN IEC 62007-1:2015+A1:2022
Semiconductor optoelectronic devices for fibre optic system applications Specification template for essential ratings and characteristics
Semiconductor optoelectronic devices for fibre optic system applications Specification template for essential ratings and characteristics
Released: 2022-11-24
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317.20 USD
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31.72 USD
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95.16 USD
English Hardcopy
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317.20 USD
BS EN IEC 62435-9:2021
Electronic components. Long-term storage of electronic semiconductor devices Special cases
Electronic components. Long-term storage of electronic semiconductor devices Special cases
Released: 2021-10-11
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195.00 USD
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19.50 USD
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58.50 USD
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195.00 USD
BS EN IEC 63244-1:2021
Semiconductor devices. Semiconductor devices for wireless power transfer and charging General requirements and specifications
Semiconductor devices. Semiconductor devices for wireless power transfer and charging General requirements and specifications
Released: 2021-11-05
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317.20 USD
You can read the standard for 1 hour. More information in the category: E-reading
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31.72 USD
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95.16 USD
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317.20 USD
BS EN IEC 63287-1:2021
Semiconductor devices. Generic semiconductor qualification guidelines Guidelines for IC reliability qualification
Semiconductor devices. Generic semiconductor qualification guidelines Guidelines for IC reliability qualification
Released: 2021-11-30
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358.80 USD
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Reading the standardfor 1 hour
35.88 USD
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
107.64 USD
English Hardcopy
In stock
358.80 USD