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BS EN IEC 60749-22-1 Semiconductor devices - Mechanical and climatic test methods Part 22-1: Bond strength - wire bond pull test methods
BS EN IEC 60749-22-1 Semiconductor devices - Mechanical and climatic test methods Part 22-1: Bond strength - wire bond pull test methods
Released: 2024-12-13
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24.00 EUR
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24.00 EUR
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264.00 EUR
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264.00 EUR
BS EN 62374:2007
Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films
Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films
Released: 2008-10-31
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264.00 EUR
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264.00 EUR
BS EN 60749-11:2002
Semiconductor devices. Mechanical and climatic test methods Rapid change of temperature. Two-fluid-bath method
Semiconductor devices. Mechanical and climatic test methods Rapid change of temperature. Two-fluid-bath method
Released: 2003-10-24
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160.80 EUR
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160.80 EUR
BS IEC 60747-1:2006+A1:2010
Semiconductor devices General
Semiconductor devices General
Released: 2010-07-31
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348.00 EUR
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348.00 EUR
PD ES 59008-5-1:2001
Data requirements for semiconductor die. Particular requirements and recommendations for die types Bare die
Data requirements for semiconductor die. Particular requirements and recommendations for die types Bare die
Released: 2001-07-15
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160.80 EUR
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160.80 EUR
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189.60 EUR
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189.60 EUR
BS EN IEC 60191-1:2018
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of discrete devices
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of discrete devices
Released: 2018-04-30
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309.60 EUR
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BS EN 60749-14:2003
Semiconductor devices. Mechanical and climatic test methods Robustness of terminations (lead integrity)
Semiconductor devices. Mechanical and climatic test methods Robustness of terminations (lead integrity)
Released: 2003-12-15
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189.60 EUR
BS EN 60749-4:2017
Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress test (HAST)
Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress test (HAST)
Released: 2017-11-28
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189.60 EUR
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189.60 EUR
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189.60 EUR
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189.60 EUR
BS EN 62418:2010
Semiconductor devices. Metallization stress void test
Semiconductor devices. Metallization stress void test
Released: 2010-08-31
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189.60 EUR