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immediate downloadReleased: 2008-10-31
BS EN 62374:2007
Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films
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| Standard number: | BS EN 62374:2007 |
| Pages: | 24 |
| Released: | 2008-10-31 |
| ISBN: | 978 0 580 54048 6 |
| Status: | Standard |
DESCRIPTION
BS EN 62374:2007
This standard BS EN 62374:2007 Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films is classified in these ICS categories:
- 31.080.99 Other semiconductor devices
- 31.080.01 Semiconductor devices in general