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31.080.01 Semiconductor devices in general
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BS EN 60191-3:2000
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of integrated circuits
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of integrated circuits
Released: 2000-06-15
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408.00 USD
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40.80 USD
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Reading the standardfor 24 hours
122.40 USD
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408.00 USD
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178.67 USD
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Reading the standardfor 1 hour
17.87 USD
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Reading the standardfor 24 hours
53.60 USD
English Hardcopy
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178.67 USD
English Secure PDF
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293.33 USD
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29.33 USD
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88.00 USD
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293.33 USD
BS IEC 62047-29:2017
Semiconductor devices. Micro-electromechanical devices Electromechanical relaxation test method for freestanding conductive thin-films under room temperature
Semiconductor devices. Micro-electromechanical devices Electromechanical relaxation test method for freestanding conductive thin-films under room temperature
Released: 2018-03-15
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210.67 USD
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21.07 USD
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63.20 USD
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210.67 USD
BS EN 60749-36:2003
Semiconductor devices. Mechanical and climatic test methods Acceleration, steady state
Semiconductor devices. Mechanical and climatic test methods Acceleration, steady state
Released: 2003-06-19
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178.67 USD
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17.87 USD
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53.60 USD
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178.67 USD
BS EN 62779-2:2016
Semiconductor devices. Semiconductor interface for human body communication Characterization of interfacing performances
Semiconductor devices. Semiconductor interface for human body communication Characterization of interfacing performances
Released: 2016-06-30
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210.67 USD
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21.07 USD
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63.20 USD
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210.67 USD
BS IEC 62483:2013
Environmental acceptance requirements for tin whisker susceptibility of tin and tin alloy surface finishes on semiconductor devices
Environmental acceptance requirements for tin whisker susceptibility of tin and tin alloy surface finishes on semiconductor devices
Released: 2013-10-31
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408.00 USD
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40.80 USD
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122.40 USD
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408.00 USD
BS EN IEC 60749-26:2018 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
Released: 2020-02-27
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573.33 USD
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573.33 USD
BS IEC 60747-18-2:2020
Semiconductor devices Semiconductor bio sensors. Evaluation process of lens-free CMOS photonic array sensor package modules
Semiconductor devices Semiconductor bio sensors. Evaluation process of lens-free CMOS photonic array sensor package modules
Released: 2020-02-21
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210.67 USD
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21.07 USD
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63.20 USD
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210.67 USD
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293.33 USD
You can read the standard for 1 hour. More information in the category: E-reading
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29.33 USD
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88.00 USD
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293.33 USD
BS EN 60749-3:2017
Semiconductor devices. Mechanical and climatic test methods External visual examination
Semiconductor devices. Mechanical and climatic test methods External visual examination
Released: 2017-11-24
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210.67 USD
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21.07 USD
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63.20 USD
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210.67 USD
BS IEC 60747-16-2:2001
Semiconductor devices Microwave integrated circuits. Frequency prescalers
Semiconductor devices Microwave integrated circuits. Frequency prescalers
Released: 2008-01-31
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344.00 USD
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34.40 USD
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Reading the standardfor 24 hours
103.20 USD
English Hardcopy
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344.00 USD