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31.080.01 Semiconductor devices in general
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BS EN 62374-1:2010
Semiconductor devices Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
Semiconductor devices Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
Released: 2011-06-30
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18.67 USD
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56.00 USD
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186.67 USD
BS EN 62374:2007
Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films
Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films
Released: 2008-10-31
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258.84 USD
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25.88 USD
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77.65 USD
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258.84 USD
BS EN 62415:2010
Semiconductor devices. Constant current electromigration test
Semiconductor devices. Constant current electromigration test
Released: 2010-07-31
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156.80 USD
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15.68 USD
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47.04 USD
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156.80 USD
BS EN 62418:2010
Semiconductor devices. Metallization stress void test
Semiconductor devices. Metallization stress void test
Released: 2010-08-31
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BS EN 62779-1:2016
Semiconductor devices. Semiconductor interface for human body communication General requirements
Semiconductor devices. Semiconductor interface for human body communication General requirements
Released: 2016-06-30
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186.67 USD
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56.00 USD
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BS EN 62779-2:2016
Semiconductor devices. Semiconductor interface for human body communication Characterization of interfacing performances
Semiconductor devices. Semiconductor interface for human body communication Characterization of interfacing performances
Released: 2016-06-30
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56.00 USD
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BS EN 62779-3:2016
Semiconductor devices. Semiconductor interface for human body communication Functional type and its operational conditions
Semiconductor devices. Semiconductor interface for human body communication Functional type and its operational conditions
Released: 2016-06-30
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186.67 USD
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18.67 USD
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56.00 USD
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BS EN IEC 60068-2-13:2021
Environmental testing Tests. Test M: Low air pressure
Environmental testing Tests. Test M: Low air pressure
Released: 2021-04-26
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56.00 USD
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BS EN IEC 60191-1:2018
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of discrete devices
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of discrete devices
Released: 2018-04-30
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303.64 USD
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30.36 USD
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91.09 USD
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303.64 USD
BS EN IEC 60747-16-6:2019
Semiconductor devices Microwave integrated circuits. Frequency multipliers
Semiconductor devices Microwave integrated circuits. Frequency multipliers
Released: 2019-09-02
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258.84 USD
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25.88 USD
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77.65 USD
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BS EN IEC 60747-5-5:2020
Semiconductor devices Optoelectronic devices. Photocouplers
Semiconductor devices Optoelectronic devices. Photocouplers
Released: 2020-09-17
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360.89 USD
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36.09 USD
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108.27 USD
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360.89 USD
BS EN IEC 60749-10:2022 - TC
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Mechanical shock. device and subassembly
Tracked Changes. Semiconductor devices. Mechanical and climatic test methods Mechanical shock. device and subassembly
Released: 2022-09-15
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243.91 USD
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243.91 USD