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Homepage>BS Standards>31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general>BS EN 60749-23:2004+A1:2011 Semiconductor devices. Mechanical and climatic test methods High temperature operating life
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immediate downloadReleased: 2011-06-30
BS EN 60749-23:2004+A1:2011 Semiconductor devices. Mechanical and climatic test methods High temperature operating life

BS EN 60749-23:2004+A1:2011

Semiconductor devices. Mechanical and climatic test methods High temperature operating life

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Standard number:BS EN 60749-23:2004+A1:2011
Pages:12
Released:2011-06-30
ISBN:978 0 580 68753 2
Status:Standard
DESCRIPTION

BS EN 60749-23:2004+A1:2011


This standard BS EN 60749-23:2004+A1:2011 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general