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Homepage>BS Standards>31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general>BS EN 60749-27:2006+A1:2012 Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Machine model (MM)
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BS EN 60749-27:2006+A1:2012 Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Machine model (MM)

BS EN 60749-27:2006+A1:2012

Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Machine model (MM)

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Standard number:BS EN 60749-27:2006+A1:2012
Pages:16
Released:2013-01-31
ISBN:978 0 580 76608 4
Status:Standard
DESCRIPTION

BS EN 60749-27:2006+A1:2012


This standard BS EN 60749-27:2006+A1:2012 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general