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Homepage>BS Standards>31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general>BS IEC 62951-5:2019 Semiconductor devices. Flexible and stretchable semiconductor devices Test method for thermal characteristics of flexible materials
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immediate downloadReleased: 2019-03-05
BS IEC 62951-5:2019 Semiconductor devices. Flexible and stretchable semiconductor devices Test method for thermal characteristics of flexible materials

BS IEC 62951-5:2019

Semiconductor devices. Flexible and stretchable semiconductor devices Test method for thermal characteristics of flexible materials

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Standard number:BS IEC 62951-5:2019
Pages:20
Released:2019-03-05
ISBN:978 0 580 97291 1
Status:Standard
DESCRIPTION

BS IEC 62951-5:2019


This standard BS IEC 62951-5:2019 Semiconductor devices. Flexible and stretchable semiconductor devices is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general
  • 31.080.99 Other semiconductor devices
IEC 62951-5:2019 specifies the test method for thermal characteristics of flexible materials. This document includes terms, definitions, symbols, and test methods that can be used to evaluate and determine thermal characteristics of flexible materials for practical use. The measurement method relies on non-contact optical thermometry that is based on temperature dependent optical reflectance. This document is applicable to both substrate and thin-film flexible semiconductor materials that are subjected to bending and stretching.