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31.080.01 Semiconductor devices in general
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BS EN 60749-38:2008
Semiconductor devices. Mechanical and climatic test methods Soft error test method for semiconductor devices with memory
Semiconductor devices. Mechanical and climatic test methods Soft error test method for semiconductor devices with memory
Released: 2008-06-30
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198.33 USD
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19.83 USD
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59.50 USD
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In stock
198.33 USD
BS EN 60749-3:2017
Semiconductor devices. Mechanical and climatic test methods External visual examination
Semiconductor devices. Mechanical and climatic test methods External visual examination
Released: 2017-11-24
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198.33 USD
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19.83 USD
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59.50 USD
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198.33 USD
BS EN 60749-40:2011
Semiconductor devices. Mechanical and climatic test methods Board level drop test method using a strain gauge
Semiconductor devices. Mechanical and climatic test methods Board level drop test method using a strain gauge
Released: 2011-09-30
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275.02 USD
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27.50 USD
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82.51 USD
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275.02 USD
BS EN 60749-42:2014
Semiconductor devices. Mechanical and climatic test methods Temperature and humidity storage
Semiconductor devices. Mechanical and climatic test methods Temperature and humidity storage
Released: 2014-10-31
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166.60 USD
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16.66 USD
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49.98 USD
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166.60 USD
BS EN 60749-44:2016
Semiconductor devices. Mechanical and climatic test methods Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
Semiconductor devices. Mechanical and climatic test methods Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
Released: 2016-11-30
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275.02 USD
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27.50 USD
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82.51 USD
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275.02 USD
BS EN 60749-4:2017
Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress test (HAST)
Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress test (HAST)
Released: 2017-11-28
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198.33 USD
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19.83 USD
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59.50 USD
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198.33 USD
BS EN 60749-6:2017
Semiconductor devices. Mechanical and climatic test methods Storage at high temperature
Semiconductor devices. Mechanical and climatic test methods Storage at high temperature
Released: 2017-11-24
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166.60 USD
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16.66 USD
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49.98 USD
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166.60 USD
BS EN 60749-7:2011
Semiconductor devices. Mechanical and climatic test methods Internal moisture content measurement and the analysis of other residual gases
Semiconductor devices. Mechanical and climatic test methods Internal moisture content measurement and the analysis of other residual gases
Released: 2011-09-30
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198.33 USD
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19.83 USD
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59.50 USD
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198.33 USD
BS EN 60749-8:2003
Semiconductor devices. Mechanical and climatic test methods Sealing
Semiconductor devices. Mechanical and climatic test methods Sealing
Released: 2003-07-03
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198.33 USD
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19.83 USD
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59.50 USD
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198.33 USD
BS EN 60749-9:2017
Semiconductor devices. Mechanical and climatic test methods Permanence of marking
Semiconductor devices. Mechanical and climatic test methods Permanence of marking
Released: 2017-11-27
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166.60 USD
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16.66 USD
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49.98 USD
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166.60 USD
BS EN 61582:2006
Radiation protection instrumentation. In vivo counters. Classification, general requirements and test procedures for portable, transportable and installed equipment
Radiation protection instrumentation. In vivo counters. Classification, general requirements and test procedures for portable, transportable and installed equipment
Released: 2006-06-30
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383.44 USD
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38.34 USD
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Reading the standardfor 24 hours
115.03 USD
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383.44 USD
BS EN 62007-2:2009
Semiconductor optoelectronic devices for fibre optic system applications Measuring methods
Semiconductor optoelectronic devices for fibre optic system applications Measuring methods
Released: 2009-10-31
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322.62 USD
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Reading the standardfor 1 hour
32.26 USD
You can read the standard for 24 hours. More information in the category: E-reading
Reading the standardfor 24 hours
96.79 USD
English Hardcopy
In stock
322.62 USD