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31.080.01 Semiconductor devices in general
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BS EN IEC 60191-1:2018
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of discrete devices
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of discrete devices
Released: 2018-04-30
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325.33 USD
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32.53 USD
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97.60 USD
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325.33 USD
BS EN 60749-1:2003
Semiconductor devices. Mechanical and climatic test methods General
Semiconductor devices. Mechanical and climatic test methods General
Released: 2003-07-07
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168.00 USD
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16.80 USD
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50.40 USD
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168.00 USD
PD IEC/TR 63133:2017
Semiconductor devices. Scan based ageing level estimation for semiconductor devices
Semiconductor devices. Scan based ageing level estimation for semiconductor devices
Released: 2018-01-29
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200.00 USD
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20.00 USD
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60.00 USD
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200.00 USD
BS EN 62418:2010
Semiconductor devices. Metallization stress void test
Semiconductor devices. Metallization stress void test
Released: 2010-08-31
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200.00 USD
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20.00 USD
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60.00 USD
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200.00 USD
BS EN 60749-14:2003
Semiconductor devices. Mechanical and climatic test methods Robustness of terminations (lead integrity)
Semiconductor devices. Mechanical and climatic test methods Robustness of terminations (lead integrity)
Released: 2003-12-15
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200.00 USD
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20.00 USD
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Reading the standardfor 24 hours
60.00 USD
English Hardcopy
In stock
200.00 USD
English Secure PDF
Immediate download
200.00 USD
You can read the standard for 1 hour. More information in the category: E-reading
Reading the standardfor 1 hour
20.00 USD
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60.00 USD
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In stock
200.00 USD
BS EN 60749-4:2017
Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress test (HAST)
Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress test (HAST)
Released: 2017-11-28
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200.00 USD
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20.00 USD
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60.00 USD
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200.00 USD
BS EN 60749-40:2011
Semiconductor devices. Mechanical and climatic test methods Board level drop test method using a strain gauge
Semiconductor devices. Mechanical and climatic test methods Board level drop test method using a strain gauge
Released: 2011-09-30
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277.33 USD
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27.73 USD
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83.20 USD
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277.33 USD
BS EN IEC 60749-12:2018
Semiconductor devices. Mechanical and climatic test methods Vibration, variable frequency
Semiconductor devices. Mechanical and climatic test methods Vibration, variable frequency
Released: 2018-04-18
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168.00 USD
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16.80 USD
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50.40 USD
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168.00 USD
BS EN 60191-6-10:2003
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of surface mounted semiconductor device packages
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of surface mounted semiconductor device packages
Released: 2004-03-31
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200.00 USD
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20.00 USD
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60.00 USD
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200.00 USD
BS EN 62415:2010
Semiconductor devices. Constant current electromigration test
Semiconductor devices. Constant current electromigration test
Released: 2010-07-31
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168.00 USD
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16.80 USD
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50.40 USD
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168.00 USD
PD IEC TR 63378-1:2021
Thermal standardization on semiconductor packages Thermal resistance and thermal parameter of BGA, QFP type semiconductor packages
Thermal standardization on semiconductor packages Thermal resistance and thermal parameter of BGA, QFP type semiconductor packages
Released: 2022-01-11
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277.33 USD
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27.73 USD
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Reading the standardfor 24 hours
83.20 USD
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277.33 USD