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31.080.01 Semiconductor devices in general
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BS EN 60191-6:2009
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of surface mounted semiconductor device packages
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of surface mounted semiconductor device packages
Released: 2010-04-30
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317.20 USD
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31.72 USD
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95.16 USD
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317.20 USD
BS EN 60745-1:2009+A11:2010
Hand-held motor-operated electric tools. Safety General requirements
Hand-held motor-operated electric tools. Safety General requirements
Released: 2011-02-28
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486.20 USD
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48.62 USD
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145.86 USD
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486.20 USD
BS EN 60749-11:2002
Semiconductor devices. Mechanical and climatic test methods Rapid change of temperature. Two-fluid-bath method
Semiconductor devices. Mechanical and climatic test methods Rapid change of temperature. Two-fluid-bath method
Released: 2003-10-24
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163.80 USD
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16.38 USD
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49.14 USD
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163.80 USD
BS EN 60749-14:2003
Semiconductor devices. Mechanical and climatic test methods Robustness of terminations (lead integrity)
Semiconductor devices. Mechanical and climatic test methods Robustness of terminations (lead integrity)
Released: 2003-12-15
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195.00 USD
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19.50 USD
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58.50 USD
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195.00 USD
BS EN 60749-16:2003
Semiconductor devices. Mechanical and climatic test methods Particle impact noise detection (PIND)
Semiconductor devices. Mechanical and climatic test methods Particle impact noise detection (PIND)
Released: 2004-06-24
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163.80 USD
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16.38 USD
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49.14 USD
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163.80 USD
BS EN 60749-19:2003+A1:2010
Semiconductor devices. Mechanical and climatic test methods Die shear strength
Semiconductor devices. Mechanical and climatic test methods Die shear strength
Released: 2010-10-31
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163.80 USD
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16.38 USD
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49.14 USD
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163.80 USD
BS EN 60749-1:2003
Semiconductor devices. Mechanical and climatic test methods General
Semiconductor devices. Mechanical and climatic test methods General
Released: 2003-07-07
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163.80 USD
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16.38 USD
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49.14 USD
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163.80 USD
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317.20 USD
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31.72 USD
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95.16 USD
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317.20 USD
BS EN 60749-21:2011
Semiconductor devices. Mechanical and climatic test methods Solderability
Semiconductor devices. Mechanical and climatic test methods Solderability
Released: 2011-08-31
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270.40 USD
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27.04 USD
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81.12 USD
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270.40 USD
BS EN 60749-22:2003
Semiconductor devices. Mechanical and climatic test methods Bond strength
Semiconductor devices. Mechanical and climatic test methods Bond strength
Released: 2003-07-04
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270.40 USD
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27.04 USD
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81.12 USD
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270.40 USD
BS EN 60749-23:2004+A1:2011
Semiconductor devices. Mechanical and climatic test methods High temperature operating life
Semiconductor devices. Mechanical and climatic test methods High temperature operating life
Released: 2011-06-30
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163.80 USD
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16.38 USD
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49.14 USD
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163.80 USD
BS EN 60749-24:2004
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST
Released: 2004-06-24
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163.80 USD
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16.38 USD
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49.14 USD
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163.80 USD