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31.080.01 Semiconductor devices in general
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25/30513804 DC
Draft BS IEC 63581-1 Semiconductor devices. The recognition criteria of defects in polished indium phosphide wafers Part 1. Classification of defects
Draft BS IEC 63581-1 Semiconductor devices. The recognition criteria of defects in polished indium phosphide wafers Part 1. Classification of defects
Released: 2025-03-25
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28.24 USD
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28.24 USD
BS EN 62298-3:2005
Teleweb application Superteletext profile
Teleweb application Superteletext profile
Released: 2005-10-14
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465.88 USD
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465.88 USD
BS IEC 60747-10:1991
Semiconductor devices Generic specification for discrete devices and integrated circuits
Semiconductor devices Generic specification for discrete devices and integrated circuits
Released: 2011-07-31
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364.24 USD
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364.24 USD
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189.18 USD
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189.18 USD
BS EN 62007-2:2009
Semiconductor optoelectronic devices for fibre optic system applications Measuring methods
Semiconductor optoelectronic devices for fibre optic system applications Measuring methods
Released: 2009-10-31
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364.24 USD
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364.24 USD
BS EN 61582:2006
Radiation protection instrumentation. In vivo counters. Classification, general requirements and test procedures for portable, transportable and installed equipment
Radiation protection instrumentation. In vivo counters. Classification, general requirements and test procedures for portable, transportable and installed equipment
Released: 2006-06-30
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432.00 USD
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432.00 USD
BS IEC 62615:2010
Electrostatic discharge sensitivity testing. Transmission line pulse (TLP). Component level
Electrostatic discharge sensitivity testing. Transmission line pulse (TLP). Component level
Released: 2011-07-31
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310.59 USD
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310.59 USD
BS EN 60749-2:2002
Semiconductor devices. Mechanical and climatic test methods Low air pressure
Semiconductor devices. Mechanical and climatic test methods Low air pressure
Released: 2002-09-24
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189.18 USD
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189.18 USD
BS IEC 60747-14-4:2011
Semiconductor devices. Discrete devices Semiconductor accelerometers
Semiconductor devices. Discrete devices Semiconductor accelerometers
Released: 2011-02-28
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465.88 USD
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465.88 USD
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223.06 USD
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223.06 USD
BS EN 60749-8:2003
Semiconductor devices. Mechanical and climatic test methods Sealing
Semiconductor devices. Mechanical and climatic test methods Sealing
Released: 2003-07-03
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223.06 USD
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223.06 USD
BS EN 60749-24:2004
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST
Released: 2004-06-24
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189.18 USD
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189.18 USD