BS EN IEC 60749-18:2019: Semiconductor Devices - Mechanical and Climatic Test Methods for Ionizing Radiation (Total Dose)

Welcome to the comprehensive guide on the BS EN IEC 60749-18:2019 standard, a crucial document for professionals in the semiconductor industry. This standard provides detailed methodologies for testing semiconductor devices under mechanical and climatic conditions, specifically focusing on the effects of ionizing radiation (total dose). Released on June 10, 2019, this standard is an essential resource for ensuring the reliability and durability of semiconductor devices in environments exposed to ionizing radiation.

Key Features of the Standard

The BS EN IEC 60749-18:2019 standard is meticulously crafted to address the challenges faced by semiconductor devices when exposed to ionizing radiation. Here are some of the key features and benefits of this standard:

• Comprehensive Coverage: With 26 pages of detailed guidelines, this standard covers a wide range of test methods to evaluate the mechanical and climatic resilience of semiconductor devices.
• Focus on Ionizing Radiation: The standard specifically addresses the impact of ionizing radiation, providing methodologies to assess the total dose effects on semiconductor devices.
• International Recognition: As a part of the IEC (International Electrotechnical Commission) standards, it is recognized globally, ensuring that your products meet international quality and safety benchmarks.
• Up-to-Date Information: Released in 2019, this standard incorporates the latest advancements and research in the field of semiconductor testing.

Why is Ionizing Radiation Testing Important?

Ionizing radiation can significantly impact the performance and longevity of semiconductor devices. It is crucial for industries such as aerospace, military, and nuclear power, where devices are often exposed to high levels of radiation. The BS EN IEC 60749-18:2019 standard provides a framework to test and ensure that semiconductor devices can withstand these harsh conditions without compromising their functionality.

Applications of the Standard

This standard is applicable to a wide range of industries and sectors, including:

• Aerospace: Ensuring that electronic components in satellites and spacecraft can endure the radiation encountered in space.
• Military: Testing devices used in defense systems to ensure they remain operational in high-radiation environments.
• Nuclear Power: Evaluating the resilience of electronic systems used in nuclear power plants.
• Medical Devices: Ensuring the reliability of semiconductor devices used in medical imaging and radiation therapy equipment.

Technical Details

Here are some technical details about the BS EN IEC 60749-18:2019 standard:

• Standard Number: BS EN IEC 60749-18:2019
• Pages: 26
• Release Date: June 10, 2019
• ISBN: 978 0 539 00234 8
• Status: Standard

Benefits of Implementing the Standard

Implementing the BS EN IEC 60749-18:2019 standard offers numerous benefits, including:

• Enhanced Product Reliability: By adhering to the standard, manufacturers can ensure that their semiconductor devices are more reliable and durable, even in challenging environments.
• Compliance with International Standards: Meeting the requirements of this standard helps companies comply with international regulations, facilitating easier market access and acceptance.
• Improved Safety: Ensuring that devices can withstand ionizing radiation enhances the safety of systems in which they are used, protecting both equipment and human lives.
• Competitive Advantage: Companies that implement this standard can differentiate themselves in the market by offering products that meet high-quality benchmarks.

Conclusion

The BS EN IEC 60749-18:2019 standard is an indispensable tool for any organization involved in the design, manufacturing, or testing of semiconductor devices. By providing a comprehensive framework for testing the effects of ionizing radiation, this standard helps ensure that semiconductor devices are robust, reliable, and ready to meet the demands of various high-stakes industries. Whether you are in aerospace, military, nuclear power, or medical fields, adhering to this standard is a step towards excellence and safety in your products.

BS EN IEC 60749-18:2019

This standard BS EN IEC 60749-18:2019 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:

• 13.110 Safety of machinery
• 25.040.99 Other industrial automation systems
• 29.020 Electrical engineering in general
• 31.080.01 Semiconductor devices in general

IEC 60749-18:2019 is available as IEC 60749-18:2019 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.

IEC 60749-18:2019 provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 (60Co) gamma ray source. Other suitable radiation sources can be used. This document addresses only steady-state irradiations, and is not applicable to pulse type irradiations. It is intended for military- and aerospace-related applications. It is a destructive test. This edition includes the following significant technical changes with respect to the previous edition:
- updates to subclauses to better align the test method with MIL-STD 883J, method 1019, including the use of enhanced low dose rate sensitivity (ELDRS) testing;
- addition of a Bibliography, which includes ASTM standards relevant to this test method.