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immediate downloadReleased: 2019-06-10
BS EN IEC 60749-18:2019
Semiconductor devices. Mechanical and climatic test methods Ionizing radiation (total dose)
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Standard number: | BS EN IEC 60749-18:2019 |
Pages: | 26 |
Released: | 2019-06-10 |
ISBN: | 978 0 539 00234 8 |
Status: | Standard |
DESCRIPTION
BS EN IEC 60749-18:2019
This standard BS EN IEC 60749-18:2019 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
- 13.110 Safety of machinery
- 25.040.99 Other industrial automation systems
- 29.020 Electrical engineering in general
- 31.080.01 Semiconductor devices in general
IEC 60749-18:2019 provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 (60Co) gamma ray source. Other suitable radiation sources can be used. This document addresses only steady-state irradiations, and is not applicable to pulse type irradiations. It is intended for military- and aerospace-related applications. It is a destructive test. This edition includes the following significant technical changes with respect to the previous edition:
- updates to subclauses to better align the test method with MIL-STD 883J, method 1019, including the use of enhanced low dose rate sensitivity (ELDRS) testing;
- addition of a Bibliography, which includes ASTM standards relevant to this test method.