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Homepage>BS Standards>31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general>22/30443678 DC BS EN 60749-34-1. Semiconductor devices. Mechanical and climatic test methods Part 34-1. Power cycling test for power semiconductor module
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immediate downloadReleased: 2022-03-30
22/30443678 DC BS EN 60749-34-1. Semiconductor devices. Mechanical and climatic test methods Part 34-1. Power cycling test for power semiconductor module

22/30443678 DC

BS EN 60749-34-1. Semiconductor devices. Mechanical and climatic test methods Part 34-1. Power cycling test for power semiconductor module

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Standard number:22/30443678 DC
Pages:21
Released:2022-03-30
Status:Draft for Comment
DESCRIPTION

22/30443678 DC


This standard 22/30443678 DC BS EN 60749-34-1. Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general

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