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immediate downloadReleased: 2020-10-23
20/30425836 DC
BS EN IEC 60749-37. Semiconductor devices. Mechanical and climatic test methods Part 37. Board level drop test method using an accelerometer
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Standard number: | 20/30425836 DC |
Pages: | 24 |
Released: | 2020-10-23 |
Status: | Draft for Comment |
DESCRIPTION
20/30425836 DC
This standard 20/30425836 DC BS EN IEC 60749-37. Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
- 31.080.01 Semiconductor devices in general