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Homepage>BS Standards>31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general>20/30425836 DC BS EN IEC 60749-37. Semiconductor devices. Mechanical and climatic test methods Part 37. Board level drop test method using an accelerometer
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immediate downloadReleased: 2020-10-23
20/30425836 DC BS EN IEC 60749-37. Semiconductor devices. Mechanical and climatic test methods Part 37. Board level drop test method using an accelerometer

20/30425836 DC

BS EN IEC 60749-37. Semiconductor devices. Mechanical and climatic test methods Part 37. Board level drop test method using an accelerometer

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Standard number:20/30425836 DC
Pages:24
Released:2020-10-23
Status:Draft for Comment
DESCRIPTION

20/30425836 DC


This standard 20/30425836 DC BS EN IEC 60749-37. Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general

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