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>BSI Standards >31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general>24/30501951 DC BS EN IEC 60749-26 Semiconductor devices - Mechanical and climatic test methods Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)
immediate downloadReleased: 2024-11-29
24/30501951 DC BS EN IEC 60749-26 Semiconductor devices - Mechanical and climatic test methods Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)

24/30501951 DC

BS EN IEC 60749-26 Semiconductor devices - Mechanical and climatic test methods Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)

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22.40 EUR
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Standard number:24/30501951 DC
Pages:53
Released:2024-11-29
Status:Draft for Comment
DESCRIPTION

24/30501951 DC


This standard 24/30501951 DC BS EN IEC 60749-26 Semiconductor devices - Mechanical and climatic test methods is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general

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