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Homepage>BS Standards>31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general>25/30511533 DC Draft BS EN 63378-6-1 Thermal standardization on semiconductor packages Part 6-1. Thermal resistance and capacitance model for transient temperature prediction at junction and measurement points. Model creation method using a datasheet of semiconductor device
immediate downloadReleased: 2025-04-09
25/30511533 DC Draft BS EN 63378-6-1 Thermal standardization on semiconductor packages Part 6-1. Thermal resistance and capacitance model for transient temperature prediction at junction and measurement points. Model creation method using a datasheet of semiconductor device

25/30511533 DC

Draft BS EN 63378-6-1 Thermal standardization on semiconductor packages Part 6-1. Thermal resistance and capacitance model for transient temperature prediction at junction and measurement points. Model creation method using a datasheet of semiconductor device

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Standard number:25/30511533 DC
Pages:16
Released:2025-04-09
Status:Draft for Comment
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25/30511533 DC


This standard 25/30511533 DC Draft BS EN 63378-6-1 Thermal standardization on semiconductor packages is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general

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