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>BSI Standards >31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general>25/30513804 DC Draft BS IEC 63581-1 Semiconductor devices. The recognition criteria of defects in polished indium phosphide wafers Part 1. Classification of defects
immediate downloadReleased: 2025-03-25
25/30513804 DC Draft BS IEC 63581-1 Semiconductor devices. The recognition criteria of defects in polished indium phosphide wafers Part 1. Classification of defects

25/30513804 DC

Draft BS IEC 63581-1 Semiconductor devices. The recognition criteria of defects in polished indium phosphide wafers Part 1. Classification of defects

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Standard number:25/30513804 DC
Pages:30
Released:2025-03-25
Status:Draft for Comment
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25/30513804 DC


This standard 25/30513804 DC Draft BS IEC 63581-1 Semiconductor devices. The recognition criteria of defects in polished indium phosphide wafers is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general

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