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>BSI Standards >31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general>25/30539990 DC Draft BS EN 63364-2 Semiconductor devices - Semiconductor devices for IoT system Part 2: Test method of semiconductor photon sources incorporating human factors for wearable equipment
immediate downloadReleased: 2025-11-13
25/30539990 DC Draft BS EN 63364-2 Semiconductor devices - Semiconductor devices for IoT system Part 2: Test method of semiconductor photon sources incorporating human factors for wearable equipment

25/30539990 DC

Draft BS EN 63364-2 Semiconductor devices - Semiconductor devices for IoT system Part 2: Test method of semiconductor photon sources incorporating human factors for wearable equipment

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Standard number:25/30539990 DC
Pages:13
Released:2025-11-13
Status:Draft for Comment
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25/30539990 DC


This standard 25/30539990 DC Draft BS EN 63364-2 Semiconductor devices - Semiconductor devices for IoT system is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general

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