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>BSI Standards >31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general>26/30544424 DC Draft BS EN 62047-59 Ed.1.0 Micro-electromechanical systems Part 59: Test methods for performances of MEMS multi-orifice balanced differential pressure flowmeter
immediate downloadReleased: 2026-02-11
26/30544424 DC Draft BS EN 62047-59 Ed.1.0 Micro-electromechanical systems Part 59: Test methods for performances of MEMS multi-orifice balanced differential pressure flowmeter

26/30544424 DC

Draft BS EN 62047-59 Ed.1.0 Micro-electromechanical systems Part 59: Test methods for performances of MEMS multi-orifice balanced differential pressure flowmeter

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Standard number:26/30544424 DC
Pages:16
Released:2026-02-11
Status:Draft for Comment
DESCRIPTION

26/30544424 DC


This standard 26/30544424 DC Draft BS EN 62047-59 Ed.1.0 Micro-electromechanical systems is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general

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