Log inSign up
LANGUAGE en
Menu
STOREMembershipHelp centerContactsDelivery chargesABOUT US News
SEARCH
0
Total price
0 USD
PRICES include / exclude VAT
Main page>BSI Standards >31 ELECTRONICS>31.080 Semiconductor devices>31.080.99 Other semiconductor devices>26/30568358 DC BS IEC 62047-63 Semiconductor devices - Micro-electromechanical systems Part 63: Tensile test method for shape-memory characteristics of MEMS materials under thermomechanical loading
immediate downloadReleased: 2026-07-31
26/30568358 DC BS IEC 62047-63 Semiconductor devices - Micro-electromechanical systems Part 63: Tensile test method for shape-memory characteristics of MEMS materials under thermomechanical loading

26/30568358 DC

BS IEC 62047-63 Semiconductor devices - Micro-electromechanical systems Part 63: Tensile test method for shape-memory characteristics of MEMS materials under thermomechanical loading

Format
Availability
Price and currency
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
27.06 USD
English Hardcopy
In stock
27.06 USD
Standard number:26/30568358 DC
Pages:17
Released:2026-07-31
Status:Draft for Comment
DESCRIPTION

26/30568358 DC


This standard 26/30568358 DC BS IEC 62047-63 Semiconductor devices - Micro-electromechanical systems is classified in these ICS categories:
  • 31.080.99 Other semiconductor devices

Print