PRICES include / exclude VAT
31.020
CURRENCY
PRICES include / exclude VAT
Price include VAT will be charged for customers of European Union – non VAT payers.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
Price exclude VAT will be charged for customers of European Union – VAT payers (with valid EU VAT number) and for customers outside of European Union.
ASTM E0668-20
Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices
Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices
Released: 2020-08-06
English PDF Redline
Immediate download
88.81 USD
PDF
Immediate download
73.83 USD
Hardcopy
In stock
73.83 USD
PDF
Immediate download
67.41 USD
Hardcopy
In stock
67.41 USD
ASTM E1854-19
Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
Released: 2019-10-21
English PDF Redline
Immediate download
88.81 USD
PDF
Immediate download
73.83 USD
Hardcopy
In stock
73.83 USD
ASTM F1190-24 - Standard Guide for Neutron Irradiation of Unbiased Electronic Components
Standard Guide for Neutron Irradiation of Unbiased Electronic Components
Standard Guide for Neutron Irradiation of Unbiased Electronic Components
Released: 01.05.2024
English PDF Redline
Immediate download
80.26 USD
English PDF
Immediate download
67.41 USD
English Hardcopy
In stock
67.41 USD
ASTM F1263-11R19
Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
Released: 2019-12-12
PDF
Immediate download
58.86 USD
Hardcopy
In stock
58.86 USD
ASTM F1467-18
Standard Guide for Use of an X-Ray Tester (?10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
Standard Guide for Use of an X-Ray Tester (?10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
Released: 2018-04-13
English PDF Redline
Immediate download
88.81 USD
PDF
Immediate download
73.83 USD
Hardcopy
In stock
73.83 USD