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Homepage>BS Standards>31 ELECTRONICS>31.200 Integrated circuits. Microelectronics>BS CECC 90112:1987 Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS read/write dynamic memories silicon monolithic circuits
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immediate downloadReleased: 1987-08-15
BS CECC 90112:1987 Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS read/write dynamic memories silicon monolithic circuits

BS CECC 90112:1987

Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS read/write dynamic memories silicon monolithic circuits

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Standard number:BS CECC 90112:1987
Pages:20
Released:1987-08-15
ISBN:0 580 35840 2
Status:Standard
DESCRIPTION

BS CECC 90112:1987


This standard BS CECC 90112:1987 Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS read/write dynamic memories silicon monolithic circuits is classified in these ICS categories:
  • 31.200 Integrated circuits. Microelectronics

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