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>BSI Standards >31 ELECTRONICS>31.080 Semiconductor devices>31.080.01 Semiconductor devices in general>BS EN 60749-4:2017 Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress test (HAST)
immediate downloadReleased: 2017-11-28
BS EN 60749-4:2017 Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress test (HAST)

BS EN 60749-4:2017

Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress test (HAST)

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Standard number:BS EN 60749-4:2017
Pages:16
Released:2017-11-28
ISBN:978 0 580 94229 7
Status:Standard
DESCRIPTION

BS EN 60749-4:2017


This standard BS EN 60749-4:2017 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general

This part of IEC 60749 provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.


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