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immediate downloadReleased: 2017-07-20
BS EN 60749-5:2017
Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life test
CURRENCY
| Standard number: | BS EN 60749-5:2017 |
| Pages: | 16 |
| Released: | 2017-07-20 |
| ISBN: | 978 0 580 95800 7 |
| Status: | Standard |
DESCRIPTION
BS EN 60749-5:2017
This standard BS EN 60749-5:2017 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
- 31.080.01 Semiconductor devices in general
This part of IEC 60749 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
This test method is considered destructive.