BS EN 60749-5:2017 - TC

This standard BS EN 60749-5:2017 - TC Tracked Changes. Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:

• 31.080.01 Semiconductor devices in general

IEC 60749-5:2017(E) provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
This second edition cancels and replaces the first edition published in 2003. This edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous edition:
a)   correction of an error in an equation;
b)   inclusion of notes for guidance;
c)   clarification of the applicability of test conditions.