BS EN 60749-7:2011

This standard BS EN 60749-7:2011 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:

• 31.080.01 Semiconductor devices in general

This International Standard specifies the testing and measurement of water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. The test is used as a measure of the quality of the sealing process and to provide information about the long-term chemical stability of the atmosphere inside the package. It is applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace. This test is destructive.