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Homepage>BS Standards>31 ELECTRONICS>31.200 Integrated circuits. Microelectronics>BS EN 61967-8:2011 Integrated circuits. Measurement of electromagnetic emissions Measurement of radiated emissions. IC stripline method
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BS EN 61967-8:2011 Integrated circuits. Measurement of electromagnetic emissions Measurement of radiated emissions. IC stripline method

BS EN 61967-8:2011

Integrated circuits. Measurement of electromagnetic emissions Measurement of radiated emissions. IC stripline method

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Standard number:BS EN 61967-8:2011
Pages:22
Released:2011-11-30
ISBN:978 0 580 64867 0
Status:Standard
DESCRIPTION

BS EN 61967-8:2011


This standard BS EN 61967-8:2011 Integrated circuits. Measurement of electromagnetic emissions is classified in these ICS categories:
  • 31.200 Integrated circuits. Microelectronics
IEC 61967-8:2011 defines a method for measuring the electromagnetic radiated emission from an integrated circuit (IC) using an IC stripline in the frequency range of 150 kHz up to 3 GHz. The IC being evaluated is mounted on an EMC test board (PCB) between the active conductor and the ground plane of the IC stripline arrangement.

This publication is to be read in conjunction with IEC 61967-1:2002.