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Homepage>BS Standards>31 ELECTRONICS>31.080 Semiconductor devices>31.080.99 Other semiconductor devices>BS EN 62047-7:2011 Semiconductor devices. Micro-electromechanical devices MEMS BAW filter and duplexer for radio frequency control and selection
immediate downloadReleased: 2011-08-31
BS EN 62047-7:2011 Semiconductor devices. Micro-electromechanical devices MEMS BAW filter and duplexer for radio frequency control and selection

BS EN 62047-7:2011

Semiconductor devices. Micro-electromechanical devices MEMS BAW filter and duplexer for radio frequency control and selection

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Standard number:BS EN 62047-7:2011
Pages:34
Released:2011-08-31
ISBN:978 0 580 60628 1
Status:Standard
DESCRIPTION

BS EN 62047-7:2011


This standard BS EN 62047-7:2011 Semiconductor devices. Micro-electromechanical devices is classified in these ICS categories:
  • 31.080.99 Other semiconductor devices
IEC 62047-7:2011 describes terms, definition, symbols, configurations, and test methods that can be used to evaluate and determine the performance characteristics of BAW resonator, filter, and duplexer devices as radio frequency control and selection devices. This standard specifies the methods of tests and general requirements for BAW resonator, filter, and duplexer devices of assessed quality using either capability or qualification approval procedures.
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