PRICES include / exclude VAT
Homepage>BS Standards>31 ELECTRONICS>31.200 Integrated circuits. Microelectronics>BS EN 62132-1:2016 Integrated circuits. Measurement of electromagnetic immunity General conditions and definitions
Sponsored link
immediate downloadReleased: 2016-03-31
BS EN 62132-1:2016 Integrated circuits. Measurement of electromagnetic immunity General conditions and definitions

BS EN 62132-1:2016

Integrated circuits. Measurement of electromagnetic immunity General conditions and definitions

Format
Availability
Price and currency
English Secure PDF
Immediate download
270.40 USD
English Hardcopy
In stock
270.40 USD
Standard number:BS EN 62132-1:2016
Pages:30
Released:2016-03-31
ISBN:978 0 580 80031 3
Status:Standard
DESCRIPTION

BS EN 62132-1:2016


This standard BS EN 62132-1:2016 Integrated circuits. Measurement of electromagnetic immunity is classified in these ICS categories:
  • 31.200 Integrated circuits. Microelectronics
IEC 62132-1:2015 provides general information and definitions about measurement of electromagnetic immunity of integrated circuits (ICs) to conducted and radiated disturbances. It also defines general test conditions, test equipment and setup, as well as the test procedures and content of the test reports for all parts of the IEC 62132 series. Test method comparison tables are included in Annex A to assist in selecting the appropriate measurement method(s). This edition includes the following significant technical changes with respect to the previous edition:
a) frequency range of 150 kHz to 1 GHz has been deleted from the title;
b) frequency step above 1 GHz has been added in Table 2 in 7.4.1;
c) IC performance classes in 8.3 have been modified;
d) Table A.1 was divided into two tables, and references to IEC 62132-8 and IEC 62132-9 have been added in the new Table A.2 in Annex A.