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immediate downloadReleased: 2011-06-30
BS EN 62374-1:2010
Semiconductor devices Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
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| Standard number: | BS EN 62374-1:2010 |
| Pages: | 20 |
| Released: | 2011-06-30 |
| ISBN: | 978 0 580 75206 3 |
| Status: | Corrigendum |
DESCRIPTION
BS EN 62374-1:2010
This standard BS EN 62374-1:2010 Semiconductor devices is classified in these ICS categories:
- 43.040.20 Lighting, signalling and warning devices
- 29.140.20 Incandescent lamps
- 31.080.01 Semiconductor devices in general
This part of IEC 62374 describes a test method, test structure and lifetime estimation method of the time-dependent dielectric breakdown (TDDB) test for inter-metal layers applied in semiconductor devices.