Log inSign up
LANGUAGE en
Menu
STOREMembershipHelp centerContactsDelivery chargesABOUT US News
SEARCH
0
Total price
0 USD
PRICES include / exclude VAT
>BSI Standards >31 ELECTRONICS>31.140 Piezoelectric and dielectric devices>BS EN IEC 60444-11:2026 - TC Tracked Changes. Measurement of quartz crystal unit parameters Standard method for the determination of the load resonance frequency <i>f</i><sub>L</sub> and the effective load capacitance <i>C</i><sub>Leff</sub> using automatic network analyzer techniques and error correction
immediate downloadReleased: 2026-06-19
BS EN IEC 60444-11:2026 - TC Tracked Changes. Measurement of quartz crystal unit parameters Standard method for the determination of the load resonance frequency <i>f</i><sub>L</sub> and the effective load capacitance <i>C</i><sub>Leff</sub> using automatic network analyzer techniques and error correction

BS EN IEC 60444-11:2026 - TC

Tracked Changes. Measurement of quartz crystal unit parameters Standard method for the determination of the load resonance frequency <i>f</i><sub>L</sub> and the effective load capacitance <i>C</i><sub>Leff</sub> using automatic network analyzer techniques and error correction

Format
Availability
Price and currency
English Secure PDF
Immediate download
Printable - You are authorized to print 1 copy
516.82 USD
English Hardcopy
In stock
516.82 USD
Standard number:BS EN IEC 60444-11:2026 - TC
Pages:74
Released:2026-06-19
ISBN:978 0 539 42643 4
Status:Tracked Changes
DESCRIPTION

BS EN IEC 60444-11:2026 - TC


This standard BS EN IEC 60444-11:2026 - TC Tracked Changes. Measurement of quartz crystal unit parameters is classified in these ICS categories:
  • 31.140 Piezoelectric devices
IEC 60444-11:2026 defines the standard method of measuring load resonance frequency fL at the nominal value of CL, and the determination of the effective load capacitance CLeff at the nominal frequency for crystals with the figure of merit M > 4. This edition includes the following significant technical changes with respect to the previous edition: a) key content of withdrawn IEC TR 60444-4 is reproduced as Annex A; b) some formulae in the first edition have been corrected.
Print