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Homepage>BS Standards>31 ELECTRONICS>31.200 Integrated circuits. Microelectronics>BS EN IEC 61967-4:2021 Integrated circuits. Measurement of electromagnetic emissions Measurement of conducted emissions. 1 Ω/150 Ω direct coupling method
immediate downloadReleased: 2021-05-06
BS EN IEC 61967-4:2021 Integrated circuits. Measurement of electromagnetic emissions Measurement of conducted emissions. 1 Ω/150 Ω direct coupling method

BS EN IEC 61967-4:2021

Integrated circuits. Measurement of electromagnetic emissions Measurement of conducted emissions. 1 Ω/150 Ω direct coupling method

CURRENCY
LANGUAGE
English
Standard number:BS EN IEC 61967-4:2021
Pages:50
Released:2021-05-06
ISBN:978 0 539 02935 2
Status:Standard
DESCRIPTION

BS EN IEC 61967-4:2021


This standard BS EN IEC 61967-4:2021 Integrated circuits. Measurement of electromagnetic emissions is classified in these ICS categories:
  • 31.200 Integrated circuits. Microelectronics
IEC 61967-4:2021 is available as IEC 61967-4:2021 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.

IEC 61967-4:2021 specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 ? resistive probe and RF voltage measurement using a 150 ? coupling network. These methods ensure a high degree of reproducibility and correlation of EME measurement results. This edition includes the following significant technical changes with respect to the previous edition: - frequency range of 150 kHz to 1 GHz has been deleted from the title; - recommended frequency range for 1 ? method has been reduced to 30 MHz; - Annex G with recommendations and guidelines for frequency range extension beyond 1 GHz has been added.
This product includes: