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>BSI Standards >31 ELECTRONICS>31.200 Integrated circuits. Microelectronics>BS EN IEC 62132-8:2026 - TC Tracked Changes. Integrated circuits. Measurement of electromagnetic immunity Measurement of radiated immunity. IC stripline method
immediate downloadReleased: 2026-04-15
BS EN IEC 62132-8:2026 - TC Tracked Changes. Integrated circuits. Measurement of electromagnetic immunity Measurement of radiated immunity. IC stripline method

BS EN IEC 62132-8:2026 - TC

Tracked Changes. Integrated circuits. Measurement of electromagnetic immunity Measurement of radiated immunity. IC stripline method

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Standard number:BS EN IEC 62132-8:2026 - TC
Pages:65
Released:2026-04-15
ISBN:978 0 539 41840 8
Status:Tracked Changes
DESCRIPTION

BS EN IEC 62132-8:2026 - TC


This standard BS EN IEC 62132-8:2026 - TC Tracked Changes. Integrated circuits. Measurement of electromagnetic immunity is classified in these ICS categories:
  • 31.200 Integrated circuits. Microelectronics
IEC 62132-8:2026 specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances using an IC stripline. This edition includes the following significant technical changes with respect to the previous edition: a) frequency range of 150 kHz to 3 GHz was deleted from the scope; b) extension of upper usable frequency to 6 GHz or higher as long as the defined requirements are fulfilled. This part of IEC 62132 is to be read in conjunction with IEC 62132-1.
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