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Homepage>BS Standards>31 ELECTRONICS>31.080 Semiconductor devices>31.080.99 Other semiconductor devices>BS IEC 60747-5-11:2019 Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of radiative and nonradiative currents of light emitting diodes
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immediate downloadReleased: 2020-01-14
BS IEC 60747-5-11:2019 Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of radiative and nonradiative currents of light emitting diodes

BS IEC 60747-5-11:2019

Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of radiative and nonradiative currents of light emitting diodes

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Standard number:BS IEC 60747-5-11:2019
Pages:16
Released:2020-01-14
ISBN:978 0 539 03263 5
Status:Standard
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BS IEC 60747-5-11:2019


This standard BS IEC 60747-5-11:2019 Semiconductor devices is classified in these ICS categories:
  • 31.080.99 Other semiconductor devices
IEC 60747-5-11:2019(E) specifies the measuring methods of radiative and nonradiative currents of single light emitting diode (LED) chips or packages without phosphor. White LEDs for lighting applications are out of the scope of this document. This document utilizes the internal quantum efficiency (IQE) as a function of current, whose measurement methods are discussed in other documents.
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