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Homepage>BS Standards>31 ELECTRONICS>31.080 Semiconductor devices>31.080.99 Other semiconductor devices>BS IEC 62047-44:2024 Semiconductor devices. Micro-electromechanical devices Test methods for dynamic performances of MEMS resonant electric-field-sensitive devices
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immediate downloadReleased: 2024-02-29
BS IEC 62047-44:2024 Semiconductor devices. Micro-electromechanical devices Test methods for dynamic performances of MEMS resonant electric-field-sensitive devices

BS IEC 62047-44:2024

Semiconductor devices. Micro-electromechanical devices Test methods for dynamic performances of MEMS resonant electric-field-sensitive devices

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Standard number:BS IEC 62047-44:2024
Pages:22
Released:2024-02-29
ISBN:978 0 539 21848 0
Status:Standard
DESCRIPTION

BS IEC 62047-44:2024


This standard BS IEC 62047-44:2024 Semiconductor devices. Micro-electromechanical devices is classified in these ICS categories:
  • 31.080.99 Other semiconductor devices