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Homepage>BS Standards>19 TESTING>19.080 Electrical and electronic testing>BS IEC 62525:2007 Standard test interface language (STIL) for digital test vector data
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immediate downloadReleased: 2007-12-31
BS IEC 62525:2007 Standard test interface language (STIL) for digital test vector data

BS IEC 62525:2007

Standard test interface language (STIL) for digital test vector data

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Standard number:BS IEC 62525:2007
Pages:144
Released:2007-12-31
ISBN:978 0 580 59313 0
Status:Standard
DESCRIPTION

BS IEC 62525:2007


This standard BS IEC 62525:2007 Standard test interface language (STIL) for digital test vector data is classified in these ICS categories:
  • 19.080 Electrical and electronic testing
  • 35.060 Languages used in information technology
  • 25.040.01 Industrial automation systems in general
Defines a test description language that: Facilitates the transfer of large volumes of digital test vector data from CAE environments to automated test equipment ATE environments; Specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a device under test (DUT); Supports the volume of test vector data generated from structured tests such as scan/automatic test pattern generation (ATPG), integral test techniques such as built-in self test (BIST), and functional test specifications for IC designs and their assemblies, in a format optimized for application in ATE environments.