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Homepage>BS Standards>31 ELECTRONICS>31.200 Integrated circuits. Microelectronics>BS IEC 62528:2007 Standard testability method for embedded core-based integrated circuits
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immediate downloadReleased: 2007-12-31
BS IEC 62528:2007 Standard testability method for embedded core-based integrated circuits

BS IEC 62528:2007

Standard testability method for embedded core-based integrated circuits

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Standard number:BS IEC 62528:2007
Pages:126
Released:2007-12-31
ISBN:978 0 580 59318 5
Status:Standard
DESCRIPTION

BS IEC 62528:2007


This standard BS IEC 62528:2007 Standard testability method for embedded core-based integrated circuits is classified in these ICS categories:
  • 31.200 Integrated circuits. Microelectronics
Defines a mechanism for the test of core designs within a system on chip (SoC).This mechanism constitutes a hardware architecture and leverages the core test language (CTL)to faciliate communication between core designers and core integrators.