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Homepage>BS Standards>29 ELECTRICAL ENGINEERING>29.045 Semiconducting materials>BS IEC 62899-503-1:2020 Printed electronics Quality assessment. Test method of displacement current measurement for printed thin-film transistor
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immediate downloadReleased: 2020-09-25
BS IEC 62899-503-1:2020 Printed electronics Quality assessment. Test method of displacement current measurement for printed thin-film transistor

BS IEC 62899-503-1:2020

Printed electronics Quality assessment. Test method of displacement current measurement for printed thin-film transistor

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Standard number:BS IEC 62899-503-1:2020
Pages:18
Released:2020-09-25
ISBN:978 0 580 97380 2
Status:Standard
DESCRIPTION

BS IEC 62899-503-1:2020


This standard BS IEC 62899-503-1:2020 Printed electronics is classified in these ICS categories:
  • 29.045 Semiconducting materials
  • 31.080.30 Transistors
IEC 62899-503-1:2020(E) specifies a test method for displacement current measurement (DCM) for printed thin film transistors (TFTs) or organic thin film transistors (OTFTs).
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