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immediate downloadReleased: 2016-01-31
BS IEC 63003:2015
Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505<sup>TM</sup>
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| Standard number: | BS IEC 63003:2015 |
| Pages: | 174 |
| Released: | 2016-01-31 |
| ISBN: | 978 0 580 91106 4 |
| Status: | Standard |
DESCRIPTION
BS IEC 63003:2015
This standard BS IEC 63003:2015 Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505TM is classified in these ICS categories:
- 25.040.01 Industrial automation systems in general
The scope of this standard is the definition of a pin map utilizing the IEEE 1505™ 1 receiver fixture interface (RFI). The pin map defined within this standard shall apply to military and aerospace automatic test equipment (ATE) testing applications.