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immediate downloadReleased: 2020-02-27
BS ISO 14701:2018 - TC
Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
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| Standard number: | BS ISO 14701:2018 - TC |
| Pages: | 54 |
| Released: | 2020-02-27 |
| ISBN: | 978 0 539 11820 9 |
| Status: | Tracked Changes |
DESCRIPTION
BS ISO 14701:2018 - TC
This standard BS ISO 14701:2018 - TC Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness is classified in these ICS categories:
- 71.040.40 Chemical analysis